Additional information
Type of Book |
Conference Proceedings |
Type of Work |
Article |
Sole Authored/Co Authored |
Co-Authored |
Author Name (s) |
VINEETH V,S. SRIRAM,ALIKHAN BASHEER,JANANI V,G C ANUPAMA, RAY WILLIAMSON,DAE WOOK KIM,ROLF RASCHER,VINEETH V |
Title of Book |
Optical Manufacturing and Testing XII |
Title of Book/Chapter/Article/Case Study) |
Sensitivity and tolerance analysis of 2D Profilometer for TMT primary mirror segments |
Month/Year |
Sep/2018 |
ISBN |
|
Pages |
|
Publishing Company/Institution |
SPIE - Society of Photo-Optical Instrumentation En |
Level |
International publisher |
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